Poststack Time Migration Velocity Analysis by CRS Diffraction Stacking

The Common Reflection Surface stack provides the stacked section as well as kinematic wavefield attributes. The importance of this attributes is recognized by identifying more and more application for them. We demonstrate a new application of the kinematic wavefield attributes for the time migration analysis. On the synthetic data we show, how this attributes can be used to effectively separate reflected and diffracted energy. After separating the diffracted wavefield we introduce a technique for poststack time migration velocity analysis. We image the diffraction only data with optimally chosen velocities based on a focusing criterion. The objectives of this work are velocity analysis implemented in the poststack domain and producing highly focused time migrated images. Due to the application in the poststack data domain the presented procedure is stable and fast. The method is demonstrated using two synthetic models including the Sigsbee2a data.