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Complex Resistivity Tomography and Spectral Induced Polarization Analysis on Laboratory Device for Soil Characterization
- Publisher: European Association of Geoscientists & Engineers
- Source: Conference Proceedings, Near Surface 2010 - 16th EAGE European Meeting of Environmental and Engineering Geophysics, Sep 2010, cp-164-00115
- ISBN: 978-90-73781-88-7
Abstract
Electrical Impedance Tomography (EIT) and Spectral Induced Polarization (SIP) are large used techniques for environmental application. The aim of this work is to understand the polarization signatures related to uncontaminated soils using typical subsoil models on laboratory targets and to build a new versatile algorithm suitable for this situations, for a future better estimation of contaminated samples. To this end a new experimental device was build up and SIP measurements were acquired on this new configuration, within 1mHz – 12 kHz frequency range. A couple of frequencies was chosen among the entire frequency range depending on sample configuration, and for each frequency value an inversion of complex resistivity data was carried out through a new algorithm developed in EIDORS environment. SIP measurements have highlighted the spectral response of water, sand and clay, in terms of polarization signatures on the phase spectra, while 2D and 3D complex resistivity inversions have shown the good resolution achieved by the EIDORS algorithm and the importance of the device configuration.