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DEEP ELECTRICAL RESISTIVITY SURVEY IN FAULTS MAPPING USING MULTI ARRAY COMBINATIONS AND 3D INVERSION FOR CORRECTING CROOKED LINE EFFECTSGold Open Access

Authors: H. Kim, M. Yi and S. Oh
Event name: SAGEEP 2019 - 32nd Annual Symposium on the Application of Geophysics to Engineering and Environmental Problems
Session: Poster Session - Monday
Publication date: 18 March 2019
Organisations: EEGS
Language: English
Info: Abstract, PDF ( 151.84Kb )

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